Speeding inspection flow


New technology Quins inspection machines at Newbury Electronics are speeding inspection times on difficult PC fabrications and assemblies.

Chris Hobson, Newbury Electronics said: We have a policy of continuous investment in latest technologies, practices and manufacturing equipment, often driven by our client’s process innovation requests, to make sure we can deliver the best possible product for our customers now and into the future.

The Quins product line offering by Altus had a great feature set and suitable equipment footprint to deploy into our inspection team vs its price point. Recommendations from other users also reduced the risk and gave us the confidence to invest in the product, with direct support through Altus.

“This has been born out in our initial deployment, where it has exceeded our expectations and has proven to be a great addition to our inspection department, aiding in accelerating inspection flow for boards that have taller devices or through hole components that would normally struggle with other AOI machines specified with SMD / lower profile components in mind.”

Anthony Oh, Technical Applications Manager- Altus added: “Since adding Quins inspection equipment to our product offering we have seen huge interest. The equipment has proven itself to be a safe investment and is increasing the quality of the finished product thanks to its impressive inspection abilities which inspects, captures and records high quality images of every PCBA being produced for traceability purposes.

“Newbury Electronics required an inspection process that allowed clear data capture of larger assemblies. Quins equipment can take away a process that was once only achievable through manual processes and increase efficiency and quality assurance.”

Newbury Electronics installed the Quins Pro UV. This innovative machine protects employees from harmful UV radiation when testing the assembly coating. Thanks to its combination of scanners and innovative software, Pro UV delivers high-resolution images and a simple optical test environment.